316	RWTH Publication No: 47316        2010        IGPM316.pdf
TITLE	Compressed Sensing and Electron Microscopy
AUTHORS	Peter Binev, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, Robert Sharpley
ABSTRACT	Compressed Sensing (CS) is a relatively new approach to signal acquisition which has as its goal to minimize the number of measurements needed of the signal in order to guarantee that it is captured to a prescribed accuracy. It is natural to inquire whether this new subject has a role to play in Electron Microscopy (EM). In this paper, we shall describe the foundations of Compressed Sensing and then examine which parts of this new theory may be useful in EM.
KEYWORDS	Compressed sensing, electron microscopy, sparsity, optimal encoding and decoding
DOI	10.1007/978-1-4614-2191-7
PUBLICATION	Modeling Nanoscale Imaging in Electron Microscopy ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev Springer eBook Collection : Chemistry and Materials Science 73-126 (2012)