316 IGPM316.pdf        December 2010
TITLE Compressed Sensing and Electron Microscopy
AUTHORS Peter Binev, Wolfgang Dahmen, Ronald DeVore, Philipp Lamby, Daniel Savu, Robert Sharpley
ABSTRACT Compressed Sensing (CS) is a relatively new approach to signal acquisition which has as its goal to minimize the number of measurements needed of the signal in order to guarantee that it is captured to a prescribed accuracy. It is natural to inquire whether this new subject has a role to play in Electron Microscopy (EM). In this paper, we shall describe the foundations of Compressed Sensing and then examine which parts of this new theory may be useful in EM.
KEYWORDS Compressed sensing, electron microscopy, sparsity, optimal encoding and decoding
DOI 10.1007/978-1-4614-2191-7
PUBLICATION Modeling Nanoscale Imaging in Electron Microscopy
ed. by Thomas Vogt ; Wolfgang Dahmen ; Peter Binev
Springer eBook Collection : Chemistry and Materials Science 73-126 (2012)